ASDevices Hosts the Ultra-Trace Gas Analysis Technology Summit at GIGIE 2026
On April 16, 2026, ASDevices was proud to host the Ultra-Trace Gas Analysis Technology Summit at the Wuxi Taihu International Expo Center, Forum 3, Hall A4, as part of the International Gas Industry Expo 2026 (GIGIE 2026).
Running from 14:00 to 17:00, the summit brought together leading experts, researchers, and industry practitioners from across China’s industrial and specialty gas sector for three hours of substantive discussion on the future of trace gas analysis. The event ran under the sub-forum theme “Innovation, Standards, and Industrial Upgrading,” with a dedicated focus on the precise analysis and detection of trace gases.
Opening: A Vision for the Future of Trace Gas Analysis
ASDevices President André Lamontagne opened the summit with an introduction speech that set the tone for the afternoon. Lamontagne outlined the key trends driving the evolution of ultra-trace gas analysis — the rapid growth of the hydrogen economy, increasingly stringent purity requirements in semiconductor manufacturing, the localization of analytical instrumentation in China, and the need for industry-wide standards that keep pace with technological advances.
As part of his introduction, Lamontagne also presented two of ASDevices’ latest innovations that directly address these trends: the KA34X Series ultra trace oxygen analyzer, which delivers true zero stability at ppb and ppt levels through its patent-pending purged-cathode coulometric sensor, and ASDevices’ new ion chromatograph, designed for the precise analysis of ionic impurities in ultra-high purity gases and process streams.
Seven Expert Presentations Covering the Full Spectrum
Following the opening, seven distinguished speakers took the floor, each addressing a critical dimension of the trace gas analysis landscape:
Zhanglong Dai, Managing Director, Jinhong Gas Co., Ltd. presented on the development trends of electronic bulk gases and the localization of analyzers in China — a topic of significant strategic importance as the domestic semiconductor industry accelerates its growth and seeks greater supply chain independence.
Kai Guo, Director, National Inspection Center, CEEDI, addressed AMC (Airborne Molecular Contamination) and CQC (China Quality Certification) analysis and standards, covering the regulatory and certification frameworks that govern trace gas measurement quality in China.
Fanfeng Deng, Director of New Energy Division, Chemical Institute, NIMTT, spoke on the development and standardization of trace analysis in fuel cell hydrogen, a rapidly evolving field where measurement accuracy is directly linked to fuel cell performance and longevity.
Luning Bian, Director, Testing Center, Dalian Guangming Chemical Industry Quality Monitoring Center Co., Ltd., presented on trace impurity analysis in specialty and electronic gases, drawing on extensive practical experience in industrial gas quality verification.
Wanghui Wei, PhD, SIMT, discussed the trace analysis of total acid and base content in gases — a measurement challenge of particular importance in specialty gas production and semiconductor process gas qualification.
Junzhou Xu, Quality Director, Jinhong Gas Co., Ltd., presented on trace impurity analysis of C₂F₆, a fluorinated compound increasingly used in semiconductor etching processes and subject to strict purity requirements.
Frank Zhu, CTO, KA Instruments (Shanghai) Co., Ltd., closed the technical program with a presentation on new technologies for ultra-trace analyzers, highlighting the latest advances in detector design, signal processing, and instrument integration.
A Forum for the Ideas That Shape the Industry
What made the summit exceptional was not just the quality of the individual presentations, but the depth of the discussion they generated. The range of perspectives — from regulatory standards to cutting-edge detector technology, from hydrogen fuel cells to fluorinated specialty gases — reflected the full complexity of the trace gas analysis field today.
Conversations between speakers and attendees continued well beyond the formal program, with participants exchanging insights on measurement challenges, calibration approaches, and the practical realities of implementing new analytical methods in production environments. This kind of peer-to-peer knowledge exchange is irreplaceable.
Why Events Like This Matter
The trace gas analysis industry is advancing rapidly, but it does so unevenly. New technologies emerge faster than standards can follow. Measurement capabilities outpace the frameworks needed to validate and compare them. Individual companies and research institutions develop best practices that remain siloed.
Bringing together manufacturers, end users, regulators, and researchers in a focused forum creates the conditions for the kind of cross-pollination that moves an industry forward. It accelerates the adoption of new methods, builds consensus on standards, and creates the professional networks that make collaboration possible.
For ASDevices, hosting this summit was both a responsibility and a privilege. With more than 30 years of expertise in ultra-trace gas analysis, we believe we have not only the knowledge but the obligation to help advance the field — not just through the instruments we build, but through the conversations and communities we help create.
Thank You to Our Speakers, Attendees, and Partners
We extend our deepest thanks to the seven speakers who gave their time and expertise to make this summit possible, to every attendee who engaged with such depth and curiosity, and to the GIGIE 2026 organizers for providing the platform.
We look forward to continuing these conversations — at future events, in our application laboratories, and in the field alongside our customers.
Contact ASDevices
Interested in learning more about ultra-trace gas analysis technology, our latest product innovations, or how ASDevices can support your measurement challenges? Get in touch with our team at sales@asdevices.com.
